At the annual Materials Science and Technology Conference (MS&T23), Bruker Corporation (Nasdaq: BRKR) today announced the release of the Hysitron TI 990 TriboIndenter, which provides higher performance, automation and performance in nanomechanical testing. The TI 990 is a comprehensive improvement Bruker's industry-leading TriboIndenter platform with new measurement modes, twice as fast test throughput and a larger 200mm x 300mm test area. These improvements provide tangible benefits for a variety of applications and markets, such as increased precision for nanoscale testing of polymer thin films, increased throughput for combinatorial materials science, and repeat analysis of full 300mm semiconductor wafers. Combining performance, ease of use, and flexibility, the TI 990 is the ideal characterization solution for polymer research, alloy engineering, and semiconductor device applications.
"Bruker's latest system includes a powerful new control tool, including its new mixed-mode feedback control, which opens up possibilities for research at both extremes of the time domain," said Professor Nathan Mara of the University of Minnesota Twin Cities. "It's amazing to see how the boundaries are being pushed for new experiments on a small scale."
"Every aspect of the TI 990 has been reimagined to optimize the testing process and capabilities," added Dr. Auden Warren, general manager of Bruker's nanomechanical testing division. “Our engineers have made everything better, from increased measurement flexibility to easier system setup and operational optimization. I look forward to the breakthrough our customers will make with this new system.”
About the Hysitron TI 990 TriboIndenter
Using several proprietary and proprietary technologies, the TI 990 enables quantitative mechanical and tribological characterization at the nanoscale. Every aspect of the measurement and analysis process incorporates updated technology, including the new Performech III controller, advanced feedback control modes, next-generation nanoDMA IV dynamic nanoindentation, and XPM II high-speed mechanical property mapping. Almost any sample can be mounted using the universal sample holder and measured over a larger test area. A top-view navigation pattern streamlines system setup in the new TriboScan 12 software, allowing for simplified remote control of the instrument.
Source: electronicproducts.com
